View CY7C1361C-100AXC_4736420.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

cy7c1361c, cy7c1363c 9-mbit (256 k 36/512 k 18) flow-through sram cypress semiconductor corporation ? 198 champion court ? san jose , ca 95134-1709 ? 408-943-2600 document number: 38-05541 rev. *m revised september 24, 2012 9-mbit (256 k 36/512 k 18) flow-through sram features supports 100 mhz, 133 mhz bus operations supports 100 mhz bus operations (automotive) 256 k 36/512 k 18 common i/o 3.3 v ? 5% and +10% core power supply (v dd ) 2.5 v or 3.3 v i/o power supply (v ddq ) fast clock-to-output times ? 6.5 ns (133-mhz version) provide high performance 2-1-1-1 access rate user-selectable burst counter supporting intel ? pentium ? interleaved or linear burst sequences separate processor and controller address strobes synchronous self-timed write asynchronous output enable available in pb-free 100-pin tqfp package and non pb-free 119-ball bga package tqfp available with 3-chip enable and 2-chip enable ieee 1149.1 jtag-compatible boundary scan ?zz? sleep mode option functional description the cy7c1361c/cy7c1363c is a 3.3 v, 256 k 36/512 k 18 synchronous flow-through srams, respectively designed to interface with high speed microprocessors with minimum glue logic. maximum access delay from clock rise is 6.5 ns (133 mhz version). a 2-bit on-chip counter captures the first address in a burst and increments the address aut omatically for the rest of the burst access. all synchronous inputs are gated by registers controlled by a positive-edge-triggered clock input (clk). the synchronous inputs include all addresses, all data inputs, address-pipelining chip enable (ce 1 ), depth-expansion chip enables (ce 2 and ce 3 [1] ), burst control inputs (adsc , adsp , and adv ), write enables (bw x , and bwe ), and global write (gw ). asynchronous inputs include the output enable (oe ) and the zz pin. the cy7c1361c/cy7c1363c enables either interleaved or linear burst sequences, selected by the mode input pin. a high selects an interleaved burst sequence, while a low selects a linear burst sequence. burst accesses can be initiated with the processor address strobe (adsp ) or the cache controller address strobe (adsc ) inputs. address advancement is controlled by the address advancement (adv ) input. addresses and chip enables are registered at rising edge of clock when either address strobe processor (adsp ) or address strobe controller (adsc ) are active. subsequent burst addresses can be internally generated as controlled by the advance pin (adv ). the cy7c1361c/cy7c1363c operates from a +3.3 v core power supply while all outputs may operate with either a +2.5 or +3.3 v supply. all inputs and outputs are jedec-standard jesd8-5-compatible. selection guide description 133 mhz 100 mhz unit maximum access time 6.5 8.5 ns maximum operating current 250 180 ma maximum cmos standby current commercial/industrial 40 40 ma automotive ? 60 ma note 1. ce 3 is for a version of 100-pin tqfp (3 chip enable option). 119-ball bga is offered only in 2 chip enable.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 2 of 34 logic block diagram ? cy7c1361c address register burst counter and logic clr q1 q0 enable register sense amps output buffers input registers memory array mode a [1:0] zz dq s dqp a dqp b dqp c dqp d a 0, a1, a adv clk adsp adsc bw d bw c bw b bw a bwe ce1 ce2 ce3 oe gw sleep control dq a , dqp a byte write register dq b , dqp b byte write register dq c , dqp c byte write register byte write register dq d , dqp d byte write register dq d , dqp d byte write register dq c , dqp c byte write register dq b , dqp b byte write register dq a , dqp a byte write register logic block diagra cyc1363c address register adv clk burst counter and logic clr q1 q0 adsc ce 1 oe sense amps memory array adsp output buffers input registers mode ce 2 ce 3 gw bwe a 0,a1,a bw b bw a dq b ,dqp b write register dq a ,dqp a write register enable register a[1:0] dqs dqp a dqp b dq b ,dqp b write driver dq a ,dqp a write driver sleep control zz
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 3 of 34 contents pin configurations ........................................................... 4 pin definitions .................................................................. 7 functional overview ........................................................ 8 single read accesses ................................................ 8 single write accesses initia ted by adsp ................... 8 single write accesses initiate d by adsc ................... 9 burst sequences ......................................................... 9 interleaved burst address tabl e ................................. 9 linear burst address table ......................................... 9 sleep mode ................................................................. 9 zz mode electrical characteri stics .............................. 9 truth table ...................................................................... 10 partial truth table for read/write ................................ 11 partial truth table for read/write ................................ 11 ieee 1149.1 serial boundary sc an (jtag) ... ........... .... 12 disabling the jtag feature ...................................... 12 test access port (tap) ............................................. 12 performing a tap r eset .......... .............. .......... 12 tap registers ...................................................... 12 tap instruction set ................................................... 12 tap controller state diagram ....................................... 14 tap controller block diagram ...................................... 15 tap timing ...................................................................... 15 tap ac switching characteristics ............................... 16 3.3 v tap ac test conditions ....................................... 16 3.3 v tap ac output load equivalent ......................... 16 2.5 v tap ac test conditions ....................................... 16 2.5 v tap ac output load equivalent ......................... 16 tap dc electrical characteristics and operating conditions ..................................................... 17 identification register definitions ................................ 18 scan register sizes ....................................................... 18 instruction codes ........................................................... 18 boundary scan order .................................................... 19 maximum ratings ........................................................... 20 operating range ............................................................. 20 neutron soft error immunity ......................................... 20 electrical characteristics ............................................... 20 capacitance .................................................................... 21 thermal resistance ........................................................ 21 ac test loads and waveforms ..................................... 22 switching characteristics .............................................. 23 timing diagrams ............................................................ 24 ordering information ...................................................... 28 ordering code definitions ..... .................................... 28 package diagrams .......................................................... 29 acronyms ........................................................................ 31 document conventions ................................................. 31 units of measure ....................................................... 31 document history page ................................................. 32 sales, solutions, and legal information ...................... 34 worldwide sales and design s upport ......... .............. 34 products .................................................................... 34 psoc solutions ......................................................... 34
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 4 of 34 pin configurations figure 1. 100-pin tqfp (14 20 1.4 mm) pinout (3 chip enables - a version) a a a a a 1 a 0 nc nc v ss v dd nc a a a a a a a a dqp b dq b dq b v ddq v ssq dq b dq b dq b dq b v ssq v ddq dq b dq b v ss nc v dd zz dq a dq a v ddq v ssq dq a dq a dq a dq a v ssq v ddq dq a dq a dqp a dqp c dq c dq c v ddq v ssq dq c dq c dq c dq c v ssq v ddq dq c dq c v dd nc v ss dq d dq d v ddq v ssq dq d dq d dq d dq d v ssq v ddq dq d dq d dqp d a a ce 1 ce 2 bw d bw c bw b bw a ce 3 v dd v ss clk gw bwe oe adsc adsp adv a a 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 mode cy7c1361c (a) (256 k 36) v ss /dnu a a a a a 1 a 0 nc nc v ss v dd nc a a a a a a a a a nc nc v ddq v ssq nc dqp a dq a dq a v ssq v ddq dq a dq a v ss nc v dd zz dq a dq a v ddq v ssq dq a dq a nc nc v ssq v ddq nc nc nc nc nc nc v ddq v ssq nc nc dq b dq b v ssq v ddq dq b dq b v dd nc v ss dq b dq b v ddq v ssq dq b dq b dqp b nc v ssq v ddq nc nc nc a a ce 1 ce 2 nc nc bw b bw a ce 3 v dd v ss clk gw bwe oe adsc adsp adv a a 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 mode cy7c1363c (512 k 18) v ss /dnu
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 5 of 34 figure 2. 100-pin tqfp (14 20 1.4 mm) pinout (2 chip enables - aj version) pin configurations (continued) a a a a a 1 a 0 nc nc v ss v dd nc nc a a a a a a a dqp b dq b dq b v ddq v ssq dq b dq b dq b dq b v ssq v ddq dq b dq b v ss nc v dd zz dq a dq a v ddq v ssq dq a dq a dq a dq a v ssq v ddq dq a dq a dqp a dqp c dq c dq c v ddq v ssq dq c dq c dq c dq c v ssq v ddq dq c dq c v dd nc v ss dq d dq d v ddq v ssq dq d dq d dq d dq d v ssq v ddq dq d dq d dqp d a a ce 1 ce 2 bw d bw c bw b bw a a v dd v ss clk gw bwe oe adsc adsp adv a a 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 mode cy7c1361c (256 k 36) v ss /dnu a a a a a 1 a 0 nc nc v ss v dd a a a a a a a a nc nc v ddq v ssq nc dqp a dq a dq a v ssq v ddq dq a dq a v ss nc v dd zz dq a dq a v ddq v ssq dq a dq a nc nc v ssq v ddq nc nc nc nc nc nc v ddq v ssq nc nc dq b dq b v ssq v ddq dq b dq b v dd nc v ss dq b dq b v ddq v ssq dq b dq b dqp b nc v ssq v ddq nc nc nc a a ce 1 ce 2 nc nc bw b bw a a v dd v ss clk gw bwe oe adsc adsp adv a a 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 mode cy7c1363c (512 k 18) v ss /dnu nc nc
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 6 of 34 figure 3. 119-ball bga (14 22 2.4 mm) pinout (2 chip enables with jtag) pin configurations (continued) 234567 1 a b c d e f g h j k l m n p r t u v ddq nc/288m nc/144m dqp c dq c dq d dq c dq d aa aa adsp v ddq ce 2 a dq c v ddq dq c v ddq v ddq v ddq dq d dq d nc nc v ddq v dd clk v dd v ss v ss v ss v ss v ss v ss v ss v ss nc/512m nc/1g nc nc tdo tck tdi tms nc/36m nc/72m nc v ddq v ddq v ddq aaa a a a a a a a a a0 a1 dq a dq c dq a dq a dq a dq b dq b dq b dq b dq b dq b dq b dq a dq a dq a dq a dq b v dd dq c dq c dq c v dd dq d dq d dq d dq d adsc nc ce 1 oe adv gw v ss v ss v ss v ss v ss v ss v ss v ss dqp a mode dqp d dqp b bw b bw c nc v dd nc bw a nc bwe bw d zz cy7c1361c (256 k 36)
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 7 of 34 pin definitions name i/o description a 0 , a 1 , a input- synchronous address inputs used to select one of the address locations . sampled at the rising edge of the clk if adsp or adsc is active low, and ce 1 , ce 2 , and ce 3 [2] are sampled active. a [1:0] feed the 2-bit counter. bw a ,bw b , bw c ,bw d input- synchronous byte write select inputs, active low . qualified with bwe to conduct byte writes to the sram. sampled on the rising edge of clk. gw input- synchronous global write enable input, active low . when asserted low on the rising edge of clk, a global write is conducted (all bytes are written, regardless of the values on bw x and bwe ). clk input- clock clock input . used to capture all synchronous inputs to the device. also used to increment the burst counter when adv is asserted low, during a burst operation. ce 1 input- synchronous chip enable 1 input, active low . sampled on the rising edge of clk. used in conjunction with ce 2 and ce 3 [2] to select/deselect the device. adsp is ignored if ce 1 is high. ce 1 is sampled only when a new external address is loaded. ce 2 input- synchronous chip enable 2 input, active high . sampled on the rising edge of clk. used in conjunction with ce 1 and ce 3 [2] to select/deselect the device. ce 2 is sampled only when a new external address is loaded. ce 3 [2] input- synchronous chip enable 3 input, active low . sampled on the rising edge of clk. used in conjunction with ce 1 and ce 2 to select/deselec t the device. ce 3 is sampled only when a new external address is loaded. oe input- asynchronous output enable, asynchronous input, active low . controls the direction of the i/o pins. when low, the i/o pins behave as outputs. when deasserted high, i/o pins are tristated, and act as input data pins. oe is masked during the first clock of a read cycle when emerging from a deselected state. adv input- synchronous advance input signal, sampled on the rising edge of clk . when asserted, it automatically increments the address in a burst cycle. adsp input- synchronous address strobe from processor, sampled on the rising edge of clk, active low . when asserted low, addresses presented to the device ar e captured in the address registers. a [1:0] are also loaded into the burst counter. when adsp and adsc are both asserted, only adsp is recognized. asdp is ignored when ce 1 is deasserted high. adsc input- synchronous address strobe from controller, sampled on the rising edge of clk, active low . when asserted low, addresses presented to the device ar e captured in the address registers. a [1:0] are also loaded into the burst counter. when adsp and adsc are both asserted, only adsp is recognized. bwe input- synchronous byte write enable input, active low . sampled on the rising edge of clk. this signal must be asserted low to conduct a byte write. zz input- asynchronous zz ?sleep? input, active high . when asserted high places the device in a non-time-critical ?sleep? condition with data integrity preserve d. for normal operation, this pin ha s to be low or left floating. zz pin has an internal pull down. dq s i/o- synchronous bidirectional data i/o lines . as inputs, they feed into an on-chip da ta register that is triggered by the rising edge of clk. as outputs, t hey deliver the data contained in t he memory location specified by the addresses presented during the previous clock rise of the read cycle. the direction of the pins is controlled by oe . when oe is asserted low, the pins behave as outputs. when high, dq s and dqp x are placed in a tristate condition. the outputs are automatically tristat ed during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of oe . dqp x i/o- synchronous bidirectional data parity i/o lines . functionally, these signals are identical to dq s . during write sequences, dqp x is controlled by bw x correspondingly. mode input- static selects burst order . when tied to gnd selects linear burst sequence. when tied to v dd or left floating selects interleaved burst sequence. this is a strap pin and should remain static during device operation. mode pin has an internal pull-up. v dd power supply power supply inputs to the core of the device . note 2. ce 3 is for a version of 100-pin tqfp (3 chip enable option). 119-ball bga is offered only in 2 chip enable.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 8 of 34 functional overview all synchronous inputs pass through input registers controlled by the rising edge of the clock. maximum access delay from the clock rise (t cdv ) is 6.5 ns (133 mhz device). the cy7c1361c/cy7c1363c supports secondary cache in systems using either a linear or interleaved burst sequence. the interleaved burst order supports pentium and i486? processors. the linear burst sequence is suited for processors that use a linear burst sequence. the burst or der is user-selectable, and is determined by sampling the mode input. accesses can be initiated with either the processor address strobe (adsp ) or the controller addre ss strobe (adsc ). address advancement through the burst sequence is controlled by the adv input. a two-bit on-chip wraparound burs t counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. byte write operations are qualified with the byte write enable (bwe ) and byte write select (bw x ) inputs. a global write enable (gw ) overrides all byte write inputs and writes data to all four bytes. all writes are simplif ied with on-chip synchronous self-timed write circuitry. three synchronous chip selects (ce 1 , ce 2 , ce 3 [3] ) and an asynchronous output enable (oe ) provide for easy bank selection and output tristate control. adsp is ignored if ce 1 is high. single read accesses a single read access is initiated when the following conditions are satisfied at clock rise: (1) ce 1 , ce 2 , and ce 3 [3] are all asserted active and (2) adsp or adsc is asserted low (if the access is initiated by adsc , the write inputs must be deasserted during this first cycle). the address presented to the address inputs is latched into the address register and the burst counter/control logic and presented to the memory core. if the oe input is asserted low, the requested data will be available at the data outputs a maximum to t cdv after clock rise. adsp is ignored if ce 1 is high. single write accesses initiated by adsp this access is initiated when the following conditions are satisfied at clock rise: (1) ce 1 , ce 2 , ce 3 [3] are all asserted active and (2) adsp is asserted low. the addresses presented are loaded into the address register and the burst inputs (gw , bwe , and bw x ) are ignored during this fi rst clock cycle. if the write inputs are asserted active (see partial truth table for read/write on page 11 for appropriate states that indicate a write) on the next clock rise, the appropriate data will be latched and written into the device.byte writes are allowed. all i/os are tristated during a byte write. since this is a common i/o device, the asynchronous oe input signal must be deasserted and the i/os must be tristated prior to the pres entation of data to dqs. as a safety precaution, the data lines are tristated once a write cycle is detected, regardless of the state of oe. v ddq i/o power supply power supply for the i/o circuitry . v ss ground ground for the core of the device . v ssq i/o ground ground for the i/o circuitry . tdo jtag serial output synchronous serial data-out to the jtag circuit . delivers data on the negative edge of tck. if the jtag feature is not being used, this pin should be left unconnect ed. this pin is not available on tqfp packages. tdi jtag serial input synchronous serial data-in to the jtag circuit . sampled on the rising edge of tck. if the jtag feature is not being used, this pin can be left floating or connected to v dd through a pull up resistor. this pin is not available on tqfp packages. tms jtag serial input synchronous serial data-in to the jtag circuit . sampled on the rising edge of tck. if the jtag feature is not being used, this pin can be disconnected or connected to v dd . this pin is not available on tqfp packages. tck jtag- clock clock input to the jtag circuitry . if the jtag feature is not being used, this pin must be connected to v ss . this pin is not available on tqfp packages. nc ? no connects . not internally connected to the die. 18 m, 36m, 72m, 144m, 288m, 576m, and 1g are address expansion pins and are not internally connected to the die. v ss /dnu ground/dnu this pin can be connected to ground or should be left floating. pin definitions (continued) name i/o description note 3. ce 3 is for a version of 100-pin tqfp (3 chip enable option). 119-ball bga is offered only in 2 chip enable.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 9 of 34 single write accesses initiated by adsc this write access is initiated when the following conditions are satisfied at clock rise: (1) ce 1 , ce 2 , and ce 3 [4] are all asserted active, (2) adsc is asserted low, (3) adsp is deasserted high, and (4) the write input signals (gw , bwe , and bw x ) indicate a write access. adsc is ignored if adsp is active low. the addresses presented are loaded into the address register and the burst counter/c ontrol logic and delivered to the memory core. the information presented to dq [a:d] is written into the specified address location. byte writes are allowed. all i/os are tristated when a write is detected , even a byte write. since this is a common i/o device, the asynchronous oe input signal must be deasserted and the i/os must be tristated prior to the presentation of data to dq s . as a safety precaution, the data lines are tristated once a write cycle is detected, regardless of the state of oe . burst sequences the cy7c1361c/cy7c1363c provides an on-chip two-bit wraparound burst counter inside the sram. the burst counter is fed by a [1:0] , and can follow either a linear or interleaved burst order. the burst order is determined by the state of the mode input. a low on mode will select a linear burst sequence. a high on mode selects an interleaved burst order. leaving mode unconnected causes the devic e to default to a interleaved burst sequence. sleep mode the zz input pin is an asynchronous input. asserting zz places the sram in a power conservation ?sleep? mode. two clock cycles are required to en ter into or exit from this ?sleep? mode. while in this mode, data inte grity is guaranteed. accesses pending when entering the ?sleep? mode are not considered valid nor is the completion of the operation guaranteed. the device must be deselected prior to entering the ?sleep? mode. ce 1 , ce 2 , ce 3 [4] , adsp , and adsc must remain inacti ve for the duration of t zzrec after the zz input returns low. interleaved burst address table (mode = floating or v dd ) first address a1:a0 second address a1:a0 third address a1:a0 fourth address a1:a0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 linear burst address table (mode = gnd) first address a1:a0 second address a1:a0 third address a1:a0 fourth address a1:a0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 zz mode electrical characteristics parameter description test conditions min max unit i ddzz sleep mode standby current zz > v dd ? ? 0.2 v commercial/industrial ? 50 ma automotive ? 60 ma t zzs device operation to zz zz > v dd ? 0.2 v ? 2t cyc ns t zzrec zz recovery time zz < 0.2 v 2t cyc ?ns t zzi zz active to sleep current th is parameter is sampled ? 2t cyc ns t rzzi zz inactive to exit sleep curr ent this parameter is sampled 0 ? ns note 4. ce 3 is for a version of 100-pin tqfp (3 chip enable option). 119-ball bga is offered only in 2 chip enable.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 10 of 34 truth table the truth table for cy7c1361c and cy7c1363c follows. [5, 6, 7, 8, 9] cycle description address used ce 1 ce 2 ce 3 zz adsp adsc adv write oe clk dq deselected cycle, power-down none h x x l x l x x x l?h tri-state deselected cycle, power-down none l l x l l x x x x l?h tri-state deselected cycle, power-down none l x h l l x x x x l?h tri-state deselected cycle, power-down none l l x l h l x x x l?h tri-state deselected cycle, power-down none x x x l h l x x x l?h tri-state sleep mode, power-down none x x x h x x x x x x tri-state read cycle, begin burst external l h l l l x x x l l?h q read cycle, begin burst external l h l l l x x x h l?h tri-state write cycle, begin burst external l h l l h l x l x l?h d read cycle, begin burst external l h l l h l x h l l?h q read cycle, begin burst external l h l l h l x h h l?h tri-state read cycle, continue burst next x x x l h h l h l l?h q read cycle, continue burst next x x x l h h l h h l?h tri-state read cycle, continue burst next h x x l x h l h l l?h q read cycle, continue burst next h x x l x h l h h l?h tri-state write cycle, continue burst next x x x l h h l l x l?h d write cycle, continue burst next h x x l x h l l x l?h d read cycle, suspend burst current x x x l h h h h l l?h q read cycle, suspend burst current x x x l h h h h h l?h tri-state read cycle, suspend burst current h x x l x h h h l l?h q read cycle, suspend burst current h x x l x h h h h l?h tri-state write cycle, suspend burst current x x x l h h h l x l?h d write cycle, suspend burst current h x x l x h h l x l?h d notes 5. x = ?don't care.? h = logic high, l = logic low. 6. write = l when any one or more byte write enable signals and bwe = l or gw = l. write = h when all byte write enable signals, bwe , gw = h. 7. the dq pins are controlled by the current cycle and the oe signal. oe is asynchronous and is not sampled with the clock. 8. the sram always initiates a read cycle when adsp is asserted, regardless of the state of gw , bwe , or bw x . writes may occur only on subsequent clocks after the adsp or with the assertion of adsc . as a result, oe must be driven high prior to the start of the write cycle to allow the outputs to tri-state. oe is a don't care for the remainder of the write cycle. 9. oe is asynchronous and is not sampled with the clock rise. it is masked internally during write cycles. during a read cycle all d ata bits are tri-state when oe is inactive or when the device is deselected, and all data bits behave as output when oe is active (low).
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 11 of 34 partial truth table for read/write the partial truth table for read/write for cy7c1361c follows. [10, 11] function (cy7c1361c) gw bwe bw d bw c bw b bw a read h h x x x x read hlhhhh write byte (a, dqp a )hlhhhl write byte (b, dqp b )hlhhlh write bytes (b, a, dqp a , dqp b )hlhhll write byte (c, dqp c )hlhlhh write bytes (c, a, dqp c , dqp a )hlhlhl write bytes (c, b, dqp c , dqp b )hlhllh write bytes (c, b, a, dqp c , dqp b , dqp a )hlhlll write byte (d, dqp d )hllhhh write bytes (d, a, dqp d , dqp a )hllhhl write bytes (d, b, dqp d , dqp a )hllhlh write bytes (d, b, a, dqp d , dqp b , dqp a )hllhll write bytes (d, b, dqp d , dqp b ) hlllhh write bytes (d, b, a, dqp d , dqp c , dqp a ) hlllhl write bytes (d, c, a, dqp d , dqp b , dqp a ) hllllh write all bytes hlllll write all bytes l x x x x x partial truth table for read/write the partial truth table for read/write for cy7c1363c follows. [10, 11] function (cy7c1363c) gw bwe bw b bw a read h h x x read h l h h write byte a ? (dq a and dqp a )hlhl write byte b ? (dq b and dqp b )hllh write all bytes h l l l write all bytes l x x x notes 10. x = ?don't care.? h = logic high, l = logic low. 11. table only lists a partial listing of the byte write combinations. any combination of bw x is valid appropriate write will be done based on which byte write is active.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 12 of 34 ieee 1149.1 serial boundary scan (jtag) the cy7c1361c incorporates a serial boundary scan test access port (tap) in the bga package only. the tqfp package does not offer this functionality. this part operates in accordance with ieee standard 1149.1-1900, but does not have the set of functions required for full 1149.1 compliance. these functions from the ieee specification are excluded because their inclusion places an added delay in the critical speed path of the sram. note that the tap controller func tions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant taps. the tap operates using jedec-standard 3.3 v or 2.5 v i/o logic levels. the cy7c1361c contains a tap controller, instruction register, boundary scan register, bypass register, and id register. disabling the jtag feature it is possible to operate the sram without using the jtag feature. to disable the tap co ntroller, tck must be tied low (v ss ) to prevent clocking of the device. tdi and tms are internally pulled up and may be unconnected. they may alternately be connected to v dd through a pull-up resistor. tdo should be left unconnected. upon power up, the device comes up in a reset state which does not interfere with the operation of the device. test access port (tap) test clock (tck) the test clock is used only with the tap controller. all inputs are captured on the rising edge of tc k. all outputs are driven from the falling edge of tck. test mode select (tms) the tms input is used to give commands to the tap controller and is sampled on the rising edge of tck. it is allowable to leave this ball unconnected if the tap is not used. the ball is pulled up internally, resulting in a logic high level. test data-in (tdi) the tdi ball is used to serially input information into the registers and can be connected to the input of any of the registers. the register between tdi and tdo is chosen by the instruction that is loaded into the tap instruction register. for information about loading the instruction register, see the tap controller state diagram on page 14 . tdi is internally pulled up and can be unconnected if the tap is unus ed in an application. tdi is connected to the most signific ant bit (msb) of any register. test data-out (tdo) the tdo output ball is used to serially clock data-out from the registers. the output is active depending upon the current state of the tap state machine (see instruction codes on page 18 ). the output changes on the falling edge of tck. tdo is connected to the least significant bit (lsb) of any register. performing a tap reset a reset is performed by forcing tms high (v dd ) for five rising edges of tck. this reset does no t affect the operation of the sram and may be performed while the sram is operating. at power up, the tap is reset internally to ensure that tdo comes up in a high z state. tap registers registers are connected betw een the tdi and tdo balls and allow data to be scanned into and out of the sram test circuitry. only one register can be selected at a time through the instruction register. data is serially loaded into the tdi ball on the rising edge of tck. data is output on the tdo ball on the falling edge of tck. instruction register three-bit instructions can be serially loaded into the instruction register. this register is loaded when it is placed between the tdi and tdo balls as shown in the tap controller block diagram on page 15 . upon power-up, the instruction register is loaded with the idcode instruction. it is also loaded with the idcode instruction if the controller is placed in a reset state as described in the previous section. when the tap controller is in th e capture-ir state, the two least significant bits are loaded with a binary ?01? pattern to enable fault isolation of the board-level serial test data path. bypass register to save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. the bypass register is a single-bit register that can be placed between the tdi and tdo balls. this enables data to be shifted through the sram with minimal delay. the by pass register is set low (v ss ) when the bypass instruction is executed. boundary scan register the boundary scan register is connected to all the input and bidirectional balls on the sram. the boundary scan register is loaded with the contents of the ram i/o ring when the tap controll er is in the capture-dr state and is then placed between the tdi and tdo balls when the controller is moved to the shift-dr state. the extest, sample/preload, and sample z instructions can be used to capture the conten ts of the i/o ring. the boundary scan order on page 19 show the order in which the bits are connected. each bit corresponds to one of the bumps on the sram package. the msb of the register is connected to tdi and the lsb is connected to tdo. identification (id) register the id register is loaded with a vendor-specific, 32-bit code during the capture-dr state when the idcode command is loaded in the instruction register . the idcode is hardwired into the sram and can be shifted out when the tap controller is in the shift-dr state. the id regist er has a vendor code and other information described in identification register definitions on page 18 . tap instruction set overview eight different instructions ar e possible with the three-bit instruction register . all combinations are listed in the instruction codes on page 18 . three of these instru ctions are listed as
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 13 of 34 reserved and should not be used. the other five instructions are described in detail in this section. the tap controller used in this sram is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented. the tap controller cannot be used to load address data or control signals into the sram and cannot preload the i/o buffers. the sram does not implement the 1149.1 commands extest or intest or the preload portion of sample/preload; rather, it performs a captur e of the i/o ring when these instructions are executed. instructions are loaded into the tap controller during the shift-ir state when the instruction register is placed between tdi and tdo. during this state, instructions are shifted through the instruction register through the tdi and tdo balls. to execute the instruction once it is shifted in, the tap controller needs to be moved into the update-ir state. extest extest is a mandatory 1149.1 instruction which is to be executed whenever the instruction r egister is loaded with all 0s. extest is not implemented in this sram tap controller, and therefore this device is not compliant to 1149.1. the tap controller does recognize an all-0 instruction. when an extest instruction is loaded into the instruction register, the sram respond s as if a sample/preload instruction has been loaded. there is one difference between the two instructions. unlike the sample/preload instruction, extest places the sram outputs in a high z state. idcode the idcode instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. it also places the instruction register between the tdi and tdo balls and enables the idcode to be shifted out of the device when the tap controller enters the shift-dr state. the idcode instruction is loade d into the instruction register upon power-up or whenever the tap controller is given a test logic reset state. sample z the sample z instruction causes the boundary scan register to be connected between the tdi and tdo balls when the tap controller is in a shift-dr state. it also places all sram outputs into a high z state. sample/preload sample/preload is a 1149.1-mandatory instruction. when the sample/preload instruct ions are loaded into the instruction register and the tap controller is in the capture-dr state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. the user must be aware that the tap controller clock can only operate at a frequency up to 20 mhz, while the sram clock operates more than an order of magnitude faster. because there is a large difference in the clock frequencies, it is possible that during the capture-dr state, an input or output undergoes a transition. the tap may then tr y to capture a signal while in transition (metastable state). this does not harm the device, but there is no guarantee as to the value that will be captured. repeatable results may not be possible. to guarantee that the boundary scan register captures the correct value of a signal, the sram signal must be stabilized long enough to meet the tap controller?s capture setup plus hold times (t cs and t ch ). the sram clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a sample/preload instruction. if this is an issue, it is still possible to capture all othe r signals and simply ignore the value of the ck and ck# captur ed in the boundary scan register. after the data is captured, it is possible to shift out the data by putting the tap into the shift-dr state. this places the boundary scan register between the tdi and tdo pins. preload enables an initial data pattern to be placed at the latched parallel outputs of the boun dary scan register cells prior to the selection of another boundary scan test operation. the shifting of data for the sample and preload phases can occur concurrently when requir ed - that is, while data captured is shifted out, the preloaded data can be shifted in. bypass when the bypass instruction is loaded in the instruction register and the tap is placed in a shift- dr state, the bypass register is placed between the tdi and tdo balls. the advantage of the bypass instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. reserved these instructions are not im plemented but are reserved for future use. do not use these instructions.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 14 of 34 tap controller state diagram the 0/1 next to each state represents t he value of tms at the rising edge of tck. test-logic reset run-test/ idle select dr-scan select ir-scan capture-dr shift-dr capture-ir shift-ir exit1-dr pause-dr exit1-ir pause-ir exit2-dr update-dr exit2-ir update-ir 1 1 1 0 1 1 0 0 1 1 1 0 0 0 0 0 0 0 0 0 1 0 1 1 0 1 0 1 1 1 1 0
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 15 of 34 tap controller block diagram tap timing bypass register 0 instruction register 0 1 2 identication register 0 1 2 29 30 31 . . . boundary scan register 0 1 2 . . x . . . selection circuitry tck tms tap controller tdi tdo selection circuitry t tl test clock (tck) 123456 t est mode select (tms) t th test data-out (tdo) t cyc test data-in (tdi) t tmsh t tmss t tdih t tdis t tdox t tdov dont care undefined
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 16 of 34 3.3 v tap ac test conditions input pulse levels ...............................................v ss to 3.3 v input rise and fall times ...................................................1 ns input timing reference levels .. ....................................... 1.5 v output reference levels ................................................ 1.5 v test load termination supply voltage ............................ 1.5 v 3.3 v tap ac out put load equivalent 2.5 v tap ac test conditions input pulse levels ............ ................................... v ss to 2.5 v input rise and fall time ....................................................1 ns input timing reference levels ... .................................... 1.25 v output reference levels .............................................. 1.25 v test load termination supply vo ltage .......................... 1.25 v 2.5 v tap ac output load equivalent tap ac switchi ng characteristics over the operating range parameter [12, 13] parameter min max unit clock t tcyc tck clock cycle time 50 ? ns t tf tck clock frequency ? 20 mhz t th tck clock high time 20 ? ns t tl tck clock low time 20 ? ns output times t tdov tck clock low to tdo valid ? 10 ns t tdox tck clock low to tdo invalid 0 ? ns set-up times t tmss tms setup to tck clock rise 5 ? ns t tdis tdi setup to tck clock rise 5 ? ns t cs capture setup to tck rise 5 ? ns hold times t tmsh tms hold after tck clock rise 5 ? ns t tdih tdi hold after clock rise 5 ? ns t ch capture hold after clock rise 5 ? ns tdo 1.5v 20pf z = 50 o 50 tdo 1.25v 20pf z = 50 o 50 notes 12. t cs and t ch refer to the setup and hold time requirements of latching data from the boundary scan register. 13. test conditions are spec ified using the load in tap ac test conditions. t r /t f = 1 ns.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 17 of 34 tap dc electrical characteristics and operating conditions (0 c < t a < +70 c; v dd = 3.3 v 0.165 v unless otherwise noted) parameter [14] description test conditions min max unit v oh1 output high voltage i oh = ?4.0 ma v ddq = 3.3 v 2.4 ? v i oh = ?1.0 ma v ddq = 2.5 v 2.0 ? v v oh2 output high voltage i oh = ?100 a v ddq = 3.3 v 2.9 ? v v ddq = 2.5 v 2.1 ? v v ol1 output low voltage i ol = 8.0 ma v ddq = 3.3 v ? 0.4 v i ol = 8.0 ma v ddq = 2.5 v ? 0.4 v v ol2 output low voltage i ol = 100 a v ddq = 3.3 v ? 0.2 v v ddq = 2.5 v ? 0.2 v v ih input high voltage v ddq = 3.3 v 2.0 v dd + 0.3 v v ddq = 2.5 v 1.7 v dd + 0.3 v v il input low voltage v ddq = 3.3 v ?0.5 0.7 v v ddq = 2.5 v ?0.3 0.7 v i x input load current gnd < v in < v ddq ?5 5 a note 14. all voltages referenced to v ss (gnd).
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 18 of 34 identification regi ster definitions instruction field cy7c1361c (256 k 36) description revision number (31:29) 000 describes the version number. device depth (28:24) [15] 01011 reserved for internal use device width (23:18) 119-ball bga 101001 defines memory type and architecture cypress device id (17:12) 100110 defines width and density cypress jedec id code (11:1) 00000110100 al lows unique identification of sram vendor. id register presence indicator (0) 1 indicates the presence of an id register. scan register sizes register name bit size ( 36) instruction 3 bypass 1 id 32 boundary scan order (119-ball bga package) 71 instruction codes instruction code description extest 000 captures i/o ring contents. places the boundary scan register between tdi and tdo. forces all sram outputs to high z state. idcode 001 loads the id register wit h the vendor id code and places the register between tdi and tdo. this operation does not affect sram operations. sample z 010 captures i/o ring contents. places th e boundary scan register between tdi and tdo. forces all sram output drivers to a high z state. reserved 011 do not use: this instruct ion is reserved for future use. sample/preload 100 captures i/o ring contents. places the boundary sca n register between tdi and tdo. does not affect sram operation. reserved 101 do not use: this instruct ion is reserved for future use. reserved 110 do not use: this instruct ion is reserved for future use. bypass 111 places the bypass register between tdi and tdo. this operation does not affect sram operations. note 15. bit #24 is ?1? in the register definitions fo r both 2.5 v and 3.3 v versions of this device.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 19 of 34 boundary scan order 119-ball bga cy7c1361c (256 k 36) bit # ball id signal name bit # ball id signal name 1 k4 clk 37 p4 a0 2h4gw 38 n4 a1 3m4bwe 39 r6 a 4f4oe 40 t5 a 5b4adsc 41 t3 a 6a4adsp 42 r2 a 7g4adv 43 r3 mode 8c3a 44 p2 dqp d 9b3a 45 p1 dq d 10 d6 dqp b 46 l2 dq d 11 h7 dq b 47 k1 dq d 12 g6 dq b 48 n2 dq d 13 e6 dq b 49 n1 dq d 14 d7 dq b 50 m2 dq d 15 e7 dq b 51 l1 dq d 16 f6 dq b 52 k2 dq d 17 g7 dq b 53 internal internal 18 h6 dq b 54 h1 dq c 19 t7 zz 55 g2 dq c 20 k7 dq a 56 e2 dq c 21 l6 dq a 57 d1 dq c 22 n6 dq a 58 h2 dq c 23 p7 dq a 59 g1 dq c 24 n7 dq a 60 f2 dq c 25 m6 dq a 61 e1 dq c 26 l7 dq a 62 d2 dqp c 27 k6 dq a 63 c2 a 28 p6 dqp a 64 a2 a 29 t4 a 65 e4 ce 1 30 a3 a 66 b2 ce 2 31 c5 a 67 l3 bw d 32 b5 a 68 g3 bw c 33 a5 a 69 g5 bw b 34 c6 a 70 l5 bw a 35 a6 a 71 internal internal 36 b6 a
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 20 of 34 maximum ratings exceeding maximum ratings may impair the useful life of the device. these user guidelines are not tested. storage temperature ............................... ?65 c to + 150 c ambient temperature with power applied ......................................... ?55 c to + 125 c supply voltage on v dd relative to gnd ......?0.5 v to + 4.6 v supply voltage on v ddq relative to gnd ..... ?0.5 v to + v dd dc voltage applied to outputs in tri-state ..........................................?0.5 v to v ddq + 0.5 v dc input voltage .............. .............. ..... ?0.5 v to v dd + 0.5 v current into outputs (low) ........................................ 20 ma static discharge voltage (per mil-std-883, method 3015) ......................... > 2001 v latch-up current ................................................... > 200 ma operating range range ambient temperature v dd v ddq commercial 0 c to +70 c 3.3 v ? ? 5% / + 10% 2.5 v ? 5% to v dd industrial ?40 c to +85 c automotive ?40 c to +125 c neutron soft error immunity parameter description test conditions typ max* unit lsbu logical single-bit upsets 25 c 361 394 fit/ mb lmbu logical multi-bit upsets 25 c 0 0.01 fit/ mb sel single event latch up 85 c 0 0.1 fit/ dev * no lmbu or sel events occurred during testing ; this column represents a statistical ? 2 , 95% confidence limit calculat ion. for more details refer to application note an54908 ?accelerated neutron ser testing and calculation of terrestrial failure rates? electrical characteristic s over the operating range parameter [16, 17] description test conditions min max unit v dd power supply voltage 3.135 3.6 v v ddq i/o supply voltage for 3.3 v i/o 3.135 v dd v for 2.5 v i/o 2.375 2.625 v v oh output high voltage for 3.3 v i/o, i oh = ?? 4.0 ma 2.4 ? v for 2.5 v i/o, i oh = ?? 1.0 ma 2.0 ? v v ol output low voltage for 3.3 v i/o, i ol = ? 8.0 ma ? 0.4 v for 2.5 v i/o, i ol = 1.0 ma ? 0.4 v v ih input high voltage [16] for 3.3 v i/o 2.0 v dd + 0.3 v v for 2.5 v i/o 1.7 v dd + 0.3 v v v il input low voltage [16] for 3.3 v i/o ?0.3 0.8 v for 2.5 v i/o ?0.3 0.7 v i x input leakage current except zz and mode gnd ? v i ? v ddq ?5 5 ? a input current of mode input = v ss ?30 ? ? a input = v dd ? 5 ? a input current of zz input = v ss ?5 ? ? a input = v dd ? 30 ? a i oz output leakage current gnd < v i < v ddq, output disabled ?5 5 ? a notes 16. overshoot: v ih(ac) < v dd + 1.5 v (pulse width less than t cyc /2), undershoot: v il(ac) > ?2 v (pulse width less than t cyc /2). 17. t power-up : assumes a linear ramp from 0 v to v dd(min) within 200 ms. during this time v ih < v dd and v ddq ? v dd .
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 21 of 34 i dd v dd operating supply current v dd = max, i out = 0 ma, f = f max = 1/t cyc 7.5 ns cycle, 133 mhz ? 250 ma 10 ns cycle, 100 mhz ? 180 i sb1 automatic ce power-down current ? ttl inputs max v dd , device deselected, v in > v ih or v in < v il , f = f max, inputs switching all speeds (commercial /industrial) ?110ma 10 ns cycle, 100 mhz (automotive) ? 150 ma i sb2 automatic ce power-down current ? cmos inputs max v dd , device deselected, v in > v dd ? 0.3 v or v in < 0.3 v, f = 0, inputs static all speeds ? 40 ma i sb3 automatic ce power-down current ? cmos inputs max v dd , device deselected, v in > v ddq ? 0.3 v or v in < 0.3 v, f = f max , inputs switching all speeds (commercial /industrial) ? 100 ma 10 ns cycle, 100 mhz (automotive) ? 120 ma i sb4 automatic ce power-down current ? ttl inputs max v dd , device deselected, v in > v ih or v in < v il , f = 0, inputs static all speeds (commercial /industrial) ? 40 ma 10 ns cycle, 100 mhz (automotive) ? 60 ma electrical characteristic s (continued) over the operating range parameter [16, 17] description test conditions min max unit capacitance parameter [18] description test conditions 100-pin tqfp max 119-ball bga max unit c in input capacitance t a = 25 ? c, f = 1 mhz, v dd = 3.3 v, v ddq = 2.5 v 55pf c clk clock input capacitance 5 5 pf c i/o input/output capacitance 5 7 pf thermal resistance parameter [18] description test conditions 100-pin tqfp package 119-ball bga package unit ? ja thermal resistance (junction to ambient) test conditions follow standard test methods and procedures for measuring thermal impedance, according to eia/jesd51 29.41 34.1 c/w ? jc thermal resistance (junction to case) 6.31 14.0 c/w note 18. tested initially and after any design or proc ess change that may affect these parameters.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 22 of 34 ac test loads and waveforms figure 4. ac test loads and waveforms output r = 317 ? r = 351 ? 5pf including jig and scope (a) (b) output r l = 50 ? z 0 = 50 ? v t = 1.5 v 3.3 v all input pulses v ddq gnd 90% 10% 90% 10% ? 1 ns ? 1 ns (c) output r = 1667 ? r = 1538 ? 5pf including jig and scope (a) (b) output r l = 50 ? z 0 = 50 ? v t = 1.25 v 2.5 v all input pulses v ddq gnd 90% 10% 90% 10% ? 1 ns ? 1 ns (c) 3.3 v i/o test load 2.5 v i/o test load
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 23 of 34 switching characteristics over the operating range parameter [19, 20] description -133 -100 unit min max min max t power v dd (typical) to the first access [21] 1?1?ms clock t cyc clock cycle time 7.5 ? 10 ? ns t ch clock high 3.0 ? 4.0 ? ns t cl clock low 3.0 ? 4.0 ? ns output times t cdv data output valid after clk rise ? 6.5 ? 8.5 ns t doh data output hold after clk rise 2.0 ? 2.0 ? ns t clz clock to low z [22, 23, 24] 0?0?ns t chz clock to high z [22, 23, 24] ? 3.5 ? 3.5 ns t oev oe low to output valid ? 3.5 ? 3.5 ns t oelz oe low to output low z [22, 23, 24] 0?0?ns t oehz oe high to output high z [22, 23, 24] ? 3.5 ? 3.5 ns set-up times t as address setup before clk rise 1.5 ? 1.5 ? ns t ads adsp , adsc setup before clk rise 1.5 ? 1.5 ? ns t advs adv setup before clk rise 1.5 ? 1.5 ? ns t wes gw , bwe , bw [a:d] setup before clk rise 1.5 ? 1.5 ? ns t ds data input setup before clk rise 1.5 ? 1.5 ? ns t ces chip enable setup 1.5 ? 1.5 ? ns hold times t ah address hold after clk rise 0.5 ? 0.5 ? ns t adh adsp , adsc hold after clk rise 0.5 ? 0.5 ? ns t weh gw , bwe , bw [a:d] hold after clk rise 0.5 ? 0.5 ? ns t advh adv hold after clk rise 0.5 ? 0.5 ? ns t dh data input hold after clk rise 0.5 ? 0.5 ? ns t ceh chip enable hold after clk rise 0.5 ? 0.5 ? ns notes 19. timing reference level is 1.5 v when v ddq = 3.3 v and is 1.25 v when v ddq = 2.5 v. 20. test conditions shown in (a) of figure 4 on page 22 unless otherwise noted. 21. this part has a voltage regulator internally; t power is the time that the power needs to be supplied above v dd(minimum) initially, before a read or write operation can be initiated. 22. t chz , t clz ,t oelz , and t oehz are specified with ac test conditions shown in part (b) of figure 4 on page 22 . transition is measured 200 mv from steady-state voltage. 23. at any given voltage and temperature, t oehz is less than t oelz and t chz is less than t clz to eliminate bus contention between srams when sharing the same data bus. these specifications do not imply a bus contention condition, but reflect paramete rs guaranteed over worst case user condi tions. device is designed to achieve high z prior to low z under the same system conditions. 24. this parameter is sampled and not 100% tested.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 24 of 34 timing diagrams figure 5. read cycle timing [25] t cyc t cl clk t adh t ads address t ch t ah t as a1 t ceh t ces data out (q) high-z t clz t doh t cdv t oehz t cdv single read burst read t oev t oelz t chz burst wraps around to its initial state t advh t advs t weh t wes t adh t ads q(a2) q(a2 + 1) q(a2 + 2) q(a1) q(a2) q(a2 + 1) q(a2 + 2) q(a2 + 3) a2 adv suspends burst deselect cycle dont care undefined adsp adsc g w, bwe,bw x ce adv oe note 25. on this diagram, when ce is low: ce 1 is low, ce 2 is high and ce 3 is low. when ce is high: ce 1 is high or ce 2 is low or ce 3 is high.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 25 of 34 figure 6. write cycle timing [26, 27] timing diagrams (continued) t cyc t cl clk t adh t ads address t ch t ah t as a1 t ceh t ces high-z burst read burst write d(a2) d(a2 + 1) d(a2 + 1) d(a1) d(a3) d(a3 + 1) d(a3 + 2) d(a2 + 3) a2 a3 extended burst write d(a2 + 2) single write t adh t ads t adh t ads t oehz t advh t advs t weh t wes t dh t ds t weh t wes byte write signals are ignored for rst cycle when adsp initiates burst adsc extends burst adv suspends burst dont care undefined adsp adsc bwe, bw x gw ce adv oe data in (d) d ata out (q) notes 26. on this diagram, when ce is low: ce 1 is low, ce 2 is high and ce 3 is low. when ce is high: ce 1 is high or ce 2 is low or ce 3 is high. 27. full width write can be initiated by either gw low; or by gw high, bwe low and bw x low.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 26 of 34 figure 7. read/write cycle timing [28, 29, 30] timing diagrams (continued) t cyc t cl clk t adh t ads address t ch t ah t as a2 t ceh t ces single write d(a3) a3 a4 burst read back-to-back reads high-z q(a2) q(a4) q(a4+1) q(a4+2) q(a4+3) t weh t wes t oehz t dh t ds t cdv t oelz a1 a5 a6 d(a5) d(a6) q(a1) back-to-back writes dont care undefined adsp adsc bwe, bw x ce adv oe data in (d) d ata out (q) notes 28. on this diagram, when ce is low: ce 1 is low, ce 2 is high and ce 3 is low. when ce is high: ce 1 is high or ce 2 is low or ce 3 is high. 29. the data bus (q) remains in high z following a writ e cycle, unless a ne w read access is initiated by adsp or adsc . 30. gw is high.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 27 of 34 figure 8. zz mode timing [31, 32] timing diagrams (continued) t zz i supply clk zz t zzrec a ll inputs (except zz) dont care i ddzz t zzi t rzzi outputs (q) high-z deselect or read only notes 31. device must be deselected when entering zz mode. see cycle de scriptions table for all possible signal conditions to deselect the device. 32. dqs are in high z when exiting zz sleep mode.
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 28 of 34 ordering code definitions ordering information the table below contains only the parts that are currently availa ble. if you don?t see what you are looking for, please contact your local sales representative. for more info rmation, visit the cypress website at www.cypress.com and refer to th e product summary page at http://www.cypress.com/products cypress maintains a worldwide network of offices, solution cent ers, manufacturer?s representat ives and distributors. to find th e office closest to you, visit us at http://www.cypress.com/go/datasheet/offices. speed (mhz) ordering code package diagram part and package type operating range 133 cy7c1361c-133axc 51-85050 100-pin tqfp (14 20 1.4 mm) pb-free (3 chip enable) commercial cy7c1363c-133axc cy7c1361c-133ajxc 51-85050 100-pin tqfp (1 4 20 1.4 mm) pb-free (2 chip enable) cy7c1363c-133ajxc cy7c1361c-133axi 51-85050 100-pin tqfp (14 20 1.4 mm) pb-free (3 chip enable) lndustrial 100 CY7C1361C-100AXC 51-85050 100-pin tqfp (14 20 1.4 mm) pb-free (3 chip enable) commercial cy7c1361c-100bgc 51-85115 119- ball bga (14 22 2.4 mm) 100 cy7c1361c-100axe 51-85050 100-pin tqfp (14 20 1.4 mm) pb-free automotive temperature range: x = c or i or e c = commercial; i = industrial; e = automotive pb-free package type: xx = a or aj or bg a = 100-pin tqfp 3 chip enable aj = 100-pin tqfp 2 chip enable bg = 119-ball bga speed grade: xxx = 100 mhz or 133 mhz process technology: c ? 90 nm 13xx = 1361 or 1363 1361 = ft, 256 kb 36 (9 mb) 1363 = ft, 512 kb 18 (9 mb) technology code: c = cmos marketing code: 7 = sram company id: cy = cypress x c 13xx c - xxx xx cy 7 x
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 29 of 34 package diagrams figure 9. 100-pin tqfp (14 20 1.4 mm) a100ra package outline, 51-85050 51-85050 *d
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 30 of 34 figure 10. 119-ball pbga (14 22 2.4 mm) bg119 package outline, 51-85115 package diagrams (continued) 51-85115 *d
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 31 of 34 acronyms document conventions units of measure acronym description bga ball grid array cmos complementary metal oxide semiconductor ce chip enable eia electronic industries alliance fbga fine-pitch ball grid array i/o input/output jedec joint electron devices engineering council jtag joint test action group lmbu logical multi-bit upsets lsb least significant bit lsbu logical single-bit upsets msb most significant bit oe output enable pbga plastic ball grid array sel single event latch up sram static random access memory tap test access port tck test clock tdi test data-in tdo test data-out tms test mode select tqfp thin quad flat pack ttl transistor-transistor logic symbol unit of measure c degree celsius mhz megahertz a microampere ma milliampere mm millimeter ms millisecond mv millivolt ns nanosecond ? ohm % percent pf picofarad vvolt wwatt
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 32 of 34 document history page document title: cy7c1361c/cy7c1363c, 9-mbit (256 k 36/512 k 18) flow-through sram document number: 38-05541 rev. ecn no. submission date orig. of change description of change ** 241690 see ecn rkf new data sheet. *a 278969 see ecn rkf updated boundary scan order (changed to match the b rev of these devices). updated boundary scan order (changed to match the b rev of these devices). *b 332059 see ecn pci updated features (removed 117 mhz frequency related information). updated selection guide (removed 117 mhz frequency related information). updated pin configurations (address expansion pins/balls in the pinouts for all packages are modified as per jedec standard). updated pin definitions (added address expansion pins). updated functional overview (updated zz mode electrical characteristics (changed maximum value of i ddzz parameter from 35 ma to 50 ma)). updated identification register definitions (splitted device width (23:18) into two rows, retained the same values for 165-ball fbga, changed device width (23:18) for 119-ball bga from 000001 to 101001). updated electrical characteristics (updated test conditions of v oh , v ol parameters, changed maximum value of i sb1 parameter from 40 ma to 110 ma, changed maximum value of i sb3 parameter from 40 ma to 100 ma respectively, changed test condition of i sb4 parameter from (v in ? v dd ? 0.3 v or v in ? 0.3 v) to (v in ? v ih or v in ?? v il ), removed 117 mhz frequency related information). updated thermal resistance (changed value of ? ja and ? jc parameters for 100-pin tqfp package from 25 c/w and 9 c/w to 29.41 c/w and 6.13 c/w respectively, changed value of ? ja and ? jc for 119-ball bga package from 25 c/w and 6 c/w to 34.1 c/w and 14.0 c/w respectively, changed value of ? ja and ? jc for 165-ball fbga package from 27 c/w and 6 c/w to 16.8 c/w and 3.0 c/w respectively). updated switching characteristics (removed 117 mhz frequency related information). updated ordering information (updated part numbers (added lead-free information for 100-pin tqfp, 119-ball bga and 165-ball fbga packages). *c 377095 see ecn pci updated electrical characteristics (updated note 17 (modified test condition from v ih < v dd to v ih ?? v dd ), changed maximum value of i sb2 parameter from 30 ma to 40 ma). *d 408298 see ecn rxu changed address of cypress semiconductor corporation from ?3901 north first street? to ?198 champion court?. updated electrical characteristics (changed ?input load current except zz and mode? to ?input leakage current except zz and mode? in the description of i x parameter). updated ordering information (updated part numbers, replaced package name column with package diagram in the ordering information table). replaced three-state with tri-state in all instances ac ross the document. *e 433033 see ecn nxr updated features (included automotive temperature range). updated selection guide (included automotive temperature range). updated functional overview (updated zz mode electrical characteristics (included automotive temperature range)). updated operating range (included automotive temperature range). updated electrical characteristics (included automotive temperature range). updated ordering information (updated part numbers).
cy7c1361c, cy7c1363c document number: 38-05541 rev. *m page 33 of 34 *f 501793 see ecn vkn updated tap ac switching characteristics (changed minimum value of t th and t tl parameters from 25 ns to 20 ns, and maximum value of t tdov parameter from 5 ns to 10 ns). updated maximum ratings (added the maximum rating for supply voltage on v ddq relative to gnd). updated ordering information . *g 2756340 08/26/2009 vkn / aesa added neutron soft error immunity . updated ordering information (by including parts that are available, and modified the disclaimer for the ordering information). updated in new template. *h 3036754 09/23/2010 njy added ordering code definitions . updated package diagrams . added acronyms and units of measure . minor edits and updated in new template. *i 3050869 10/07/2010 njy updated ordering information (removed cy7c1363c-133ajxi). *j 3096309 11/28/2010 njy updated pin definitions . *k 3367594 09/09/2011 prit updated package diagrams . updated in new template. *l 3612494 05/09/2012 prit updated functional description (removed the note ?for best-practices recommendations, refer to the cypress application note system design guidelines on www.cypress.com .? and its reference). updated pin configurations (removed 165-ball fbga package related information, updated figure 3 (removed cy7c1363c related information)). updated ieee 1149.1 serial boundary scan (jtag) (removed cy7c1363c related information). updated identification register definitions (removed cy7c1363c related information, removed 165-ball fbga package related information). updated scan register sizes (removed ?bit size ( 18)? column, removed 165-ball fbga package related information). updated boundary scan order (removed cy7c1363c related information). removed boundary scan order (corresponding to 165-ball fbga package). updated capacitance (removed 165-ball fbga package related information). updated thermal resistance (removed 165-ball fbga package related information). updated package diagrams (removed 165-ball fbga package related information (spec 51-85180)). *m 3753416 09/24/2012 prit updated package diagrams (spec 51-85115 (changed revision from *c to *d)). document history page (continued) document title: cy7c1361c/cy7c1363c, 9-mbit (256 k 36/512 k 18) flow-through sram document number: 38-05541 rev. ecn no. submission date orig. of change description of change
document number: 38-05541 rev. *m revised september 24, 2012 page 34 of 34 all products and company names mentioned in this document may be the trademarks of their respective holders. cy7c1361c, cy7c1363c ? cypress semiconductor corporation, 2004-2012. the information contained herein is subject to change without notice. cypress s emiconductor corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a cypress product. nor does it convey or imply any license under patent or other rights. cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement wi th cypress. furthermore, cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. the inclusion of cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. any source code (software and/or firmware) is owned by cypress semiconductor corporation (cypress) and is protected by and subj ect to worldwide patent protection (united states and foreign), united states copyright laws and internatio nal treaty provisions. cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the cypress source code and derivative works for the sole purpose of creating custom software and or firmware in su pport of licensee product to be used only in conjunction with a cypress integrated circuit as specified in the applicable agreement. any reproduction, modification, translation, compilation, or repre sentation of this source code except as specified above is prohibited without the express written permission of cypress. disclaimer: cypress makes no warranty of any kind, express or implied, with regard to this material, including, but not limited to, the implied warranties of merchantability and fitness for a particular purpose. cypress reserves the right to make changes without further notice to t he materials described herein. cypress does not assume any liability arising out of the application or use of any product or circuit described herein. cypress does not authori ze its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. the inclusion of cypress? prod uct in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. use may be limited by and subject to the applicable cypress software license agreement. sales, solutions, and legal information worldwide sales and design support cypress maintains a worldwide network of offices, solution center s, manufacturer?s representatives, and distributors. to find t he office closest to you, visit us at cypress locations . products automotive cypress.co m/go/automotive clocks & buffers cypress.com/go/clocks interface cypress. com/go/interface lighting & power control cypress.com/go/powerpsoc cypress.com/go/plc memory cypress.com/go/memory optical & image sensing cypress.com/go/image psoc cypress.com/go/psoc touch sensing cyp ress.com/go/touch usb controllers cypress.com/go/usb wireless/rf cypress.com/go/wireless psoc solutions psoc.cypress.com/solutions psoc 1 | psoc 3 | psoc 5

▲Up To Search▲

Price & Availability of CY7C1361C-100AXC

	To Download CY7C1361C-100AXC Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .